Analysis of diffraction contrast as a function of energy loss in energy-filtered transmission electron microscope imaging

摘要: The relationship between diffraction contrast and electron energy loss was investigated by obtaining energy-filtering transmission microscope images of a bend contour in aluminum 100 eV increments from 0 to 1000 eV. Results show that: (i) the is an exponentially decaying function which becomes approximately zero at under experimental conditions employed, (ii) there large influence on energy-filtered (EFI), particularly jump-ratio images, out several hundred loss, (iii) while blurring EFI due increase characteristic scattering angle inelastic electrons associated with intensity proportional total image intensity, (iv) does not become negligible acquired increasing until noisy contains little usable signal, indicating that always present some degree EFI. This can be attributed plural since high-angle Bragg (elastic) events redistribute signal plane outside collection aperture. Finally, dynamical two-beam calculation presented describes as both tilt parameter for comparison results.