作者: Yi-Chien Weng , Chih-Wei Cheng , G. Chern
DOI: 10.1109/TMAG.2013.2245308
关键词: Materials science 、 Sputter deposition 、 Sputtering 、 Condensed matter physics 、 Antiferromagnetism 、 Annealing (metallurgy) 、 Tunnel junction 、 Ferromagnetism 、 Anisotropy energy 、 Coupling
摘要: We fabricated a series of Co40Fe40B20 (1.2 nm)/MgO(x nm)/Co20Fe60B20 nm), x = 0.9-1.5, by sputtering and found the presence interlayer-exchange-coupling (IEC), as function thickness MgO spacer, perpendicular magnetic anisotropy (PMA) after post annealing at 225°C. The coupling strength sign (corresponded to parallel or antiparallel coupling), which were characterized minor loop shift, varied depending upon layer thickness. In addition, energy constant (Ku) exchange (J) show inverse relation temperature varies in range 225°C-370°. increases while decreases from ferromagnetic antiferromagnetic increases. This effect seems be consistent with recent report theoretical calculation based on orange peel model. A comparison between experimental results model will given.