Online BIST and BIST-based diagnosis of FPGA logic blocks

摘要: We present the first online built-in self-test (BIST) and BIST-based diagnosis of programmable logic resources in field-programmable gate arrays (FPGAs). These techniques were implemented used a roving self-testing areas (STARs) approach to testing reconfiguration FPGAs for fault-tolerant applications. The BIST provides complete blocks (PLBs) FPGA during normal system operation. can identify any group faulty PLBs, then applies additional diagnostic configurations look-up table or flip-flop within PLB. ability locate defective modules inside PLB enables new form fault-tolerance that reuses partially PLBs their fault-free modes