作者: Takaya Suzuki , Akio Mimura , Shinji Okuhara , Seturo Yagyu
DOI:
关键词: Single crystal 、 Silicon nitride 、 Passivation 、 Materials science 、 Diffusion process 、 Oxygen 、 Integrated circuit 、 Silicon oxide 、 Semiconductor 、 Optoelectronics 、 Electronic engineering
摘要: In a monolithic semiconductor integrated circuit, when polycrystalline is used in portion of substrate insulatively supporting plural single crystal regions forming circuit elements, the oxidation process impurity diffusion at high temperatures and oxygen atmosphere started after passivation film such as silicon oxide or nitride, to prevent from diffusing penetrating into surface semiconductor, has been formed on same surface. By leaving lying that during warping may be caused due penetration region prevented.