Spiral Scanning With Improved Control for Faster Imaging of AFM

作者: M. S. Rana , H. R. Pota , I. R. Petersen , None

DOI: 10.1109/TNANO.2014.2309653

关键词: Raster scanPerformance improvementMIMOModel predictive controlMaterials scienceAtomic force microscopyElectronic engineeringOpticsCapacitive sensingBandwidth (signal processing)Scanner

摘要: One of the key barriers to an atomic force microscope (AFM) achieving high scanning speeds is its use traditional zig-zag raster pattern technique. In this paper, we consider a high-speed spiral imaging technique with improved multi-input multi-output (MIMO) model predictive control (MPC) scheme damping compensator for faster by AFM. The controller’s design based on identified MIMO AFM’s piezoelectric tube scanner (PTS) and it achieves higher closed-loop bandwidth, significant resonant mode PTS, reduces cross-coupling effect between PTS’s axes. spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making possible achieve tracking continuous rather than being restricted back forth motion scanning. To evaluate performance improvement using proposed scanning, experimental comparison scanned images those open-loop condition performed. Experimental results show that, method, speed significantly increased up 180 Hz.

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