Direct determination of trace impurities in niobium pentaoxide solid powder with slurry sampling fluorination assisted electrothermal vaporization inductively coupled plasma mass spectrometry

摘要: A method of fluorination assisted electrothermal vaporization inductively coupled plasma mass spectrometry (FETV-ICP-MS) was developed to directly determine the trace impurities in niobium pentaoxide solid powder which a poly(tetrafluoroethylene) (PTFE) emulsion used as fluorinating modifier promote refractory elements from graphite furnace and avoid formation thermally stable carbides. The sample introduced into form slurry without any chemical pretreatments. vaporizer device connected ICP system by laboratory-built interface, flow rates carrier gas auxiliary were optimized experimentally. potentially polyatomic interferences resulting pyrolysates PTFE evaluated. new stepwise diluting matrix is proposed for investigating effect results showed that no obvious observed with (Nb2O5) concentration less than 200 mg L−1. Under optimal conditions, absolute limits detection FETV-ICP-MS determination Ta, Ti, Cr, W, Ni, Cu Mn range 0.026–1.1 pg. For one analysis run, only 0.002 Nb2O5 required. has been applied determining powder, both obtained external calibration standard addition good agreement those conventional nebulization ICP-MS.