Conduction mechanisms deduced from thermoelectric power and direct-current conductivity measurements in co-evaporated Mn/SiOx thin films

作者: S. Z. A ZAIDI , J BEYNON , C. B STEELE

DOI: 10.1023/A:1018660305138

关键词: Atmospheric temperature rangeConductivityElectrical resistivity and conductivityMaterials scienceFermi levelSeebeck coefficientCondensed matter physicsDelocalized electronThermoelectric materialsThermal conduction

摘要: … X-ray photoelectron spectroscopy A typical X-ray photoelectron spectrum of co-evaporated Mn/SiO V films containing 5 at% Mn and 100 nm thickness is shown in Fig. 1. The presence …

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