Refractive index dispersion and anisotropy in Cr4+:Mg2SiO4
作者： Z Burshtein , Y Shimony
DOI: 10.1016/S0925-3467(02)00050-2
关键词: Single crystal 、 Materials science 、 Dispersion (chemistry) 、 Anisotropy 、 Refractive index 、 Birefringence 、 Prism 、 Orthorhombic crystal system 、 Crystal 、 Optics
摘要: Abstract Room-temperature refractive index dispersion and anisotropy were measured in the orthorhombic Cr4+:Mg2SiO4 (Cr4+:forsterite) single crystal between 300 2000 nm. Use was made of bireflection an oriented prism birefringence modulation plane-parallel sample for obtaining accurate measurements anisotropy. Minimum-deviation measurement provided one axes, whence other two axes as well. The is biaxial, its dielectric principal X, Y, Z, coincide with crystallographic b, a, c respectively. Taking 632.8 nm (the HeNe laser line) a representative wavelength visible range, indices would be na=1.6505±0.0005, nb=1.6365±0.0006, nc=1.6685±0.0006. curves fitted to different Sellemeier functions. Our results very useful design compensating elements group-velocity short-pulse cavities.
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