作者: HY Yu , XD Feng , D Grozea , ZH Lu , RNS Sodhi
DOI: 10.1063/1.1367897
关键词: Band gap 、 Work function 、 X-ray photoelectron spectroscopy 、 Analytical chemistry 、 Electronic structure 、 Chemistry 、 Indium tin oxide 、 Tin 、 Indium 、 Fermi level
摘要: … XPS has been used to study the electronic structures of indium tin oxide ITO surfaces treated by O , Ar … The XPS data show that there is a significant change in core level energies (In 3d5/…