Microwave dielectric properties measurements of potential HTSC substrate materials

作者: Jyh Sheen , Ruyan Guo , A. S. Bhalla , L. E. Cross

DOI: 10.1080/00150199308222431

关键词: MicrowaveCeramicMaterials scienceSubstrate (electronics)DielectricResonancePermittivityDielectric lossAnalytical chemistrySuperconductivity

摘要: Abstract The dielectric properties of some potential substrate materials for the high-Tc superconducting film were measured at 5 to 11 GHz by using different microwave resonance techniques 300 K and 77 K. constants quality factors ceramics Ba(Mg1/3Ta2/3)O3, Sr(Al1/2Ta1/2)O3, Sr(Al1/2Nb1/2)O3, Sr(Ga1/2Ta1/2)O3, their solid solutions with NdGaO3 LaAlO3 measured. These have shown in range 10.7 26.9 1,750 35,200 Discussions about suitable measurement are also given. accuracies both constant factor measurements within 2%.

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