作者: Ayushi Paliwal , Anjali Sharma , Monika Tomar , Vinay Gupta
DOI: 10.1063/1.4862962
关键词: Raman spectroscopy 、 Plasmon 、 Analytical chemistry 、 Surface plasmon resonance 、 Materials science 、 Sputtering 、 Thin film 、 Prism 、 Sputter deposition 、 Dielectric
摘要: Indigenously assembled surface plasmon resonance (SPR) technique has been exploited to study the thickness dependent dielectric properties of WO3 thin films. films (80 nm 200 nm) have deposited onto gold (Au) coated glass prism by sputtering technique. The structural, optical and morphology were studied using X-ray diffraction, UV-visible spectrophotometer, Raman spectroscopy, Scanning electron microscopy (SEM). XRD analysis shows that all are exhibiting preferred (020) orientation data indicates possess single phase monoclinic structure. SEM images reveal variation in grain size with increase thickness. SPR reflectance curves WO3/Au/prism structure utilized estimate at frequency (λ = 633 nm). As film increases from 80 nm 200 nm, constant is seen be decreasin...