Total reflection hard x-ray photoelectron spectroscopy: Applications to strongly correlated electron systems
作者： H. Kumigashira , K. Horiba , Y. Iwasa , K. Fujii , H. Matsuoka
DOI: 10.1103/PHYSREVB.103.205113
关键词: Total internal reflection 、 Analytical chemistry 、 Materials science 、 X-ray photoelectron spectroscopy 、 Strongly correlated material
摘要:
sci-hub.st 参考文章(24)
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