作者: Robert L. DeLeon , Mukesh P. Joshi , Eric F. Rexer , Paras N. Prasad , James F. Garvey
DOI: 10.1016/S0169-4332(97)00650-8
关键词: Materials science 、 Thin film 、 Polymer 、 Pulsed laser deposition 、 Analytical chemistry 、 Optoelectronics 、 Silicon 、 Substrate (electronics) 、 Raman scattering 、 Fourier transform infrared spectroscopy 、 Aluminium oxides
摘要: Abstract Laser assisted molecular beam deposition (LAMBD) is a pulsed laser ablation technique which utilizes train of gas pulses to precisely control the chemistry and transport species be deposited on substrate. The LAMBD has been used grow films variety substrates ablate target materials including: metals, metal oxides, halides, Si, C SiC. In addition, more complex composite such as Cu embedded polymers, YBa2Cu3O7−x organic doped TiO2 Al2O3 have also produced. These analyzed by Raman scattering, SEM, EDX, FTIR, ESCA, NMR, mass spectrometry surface profile measurements determine film structure composition. Recent progress source characterization emission spectroscopy new design will presented. results demonstrate potential using sources means depositing high quality single multiple component films.