作者: B. Abdel Samad , P. V. Ashrit
DOI: 10.1117/12.2074389
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摘要: Vanadium pentoxide V 2 O 5 thin films were grown on glass substrates by the LAMBD deposition system with different laser energies. The structure, composition and optical properties of have been investigated atomic force microscopy, x-ray photoemission spectroscopy, ellipsometry transmittance analysis. Upon increase energy, results showed that changes in constants are consistent thickness film. refractive index increases absorption coefficient when energy increases. AFM analysis a change roughness structure deposited at prepared interesting correct phase without need annealing after deposition.