作者: G. De , M. Gusso , L. Tapfer , M. Catalano , F. Gonella
DOI: 10.1063/1.363800
关键词: Rutherford backscattering spectrometry 、 Nanoclusters 、 Copper 、 Analytical chemistry 、 Absorption spectroscopy 、 Annealing (metallurgy) 、 Materials science 、 Thin layers 、 Thin film 、 Sol-gel
摘要: Silver, copper, and mixed silver–copper nanocluster‐doped silica thin layers were prepared by the sol‐gel process. Samples heat treated in different annealing atmospheres (air, argon, or 5%H2–95%N2) temperature range 500–1100 °C. Specimens characterized optical absorption spectroscopy, Rutherford backscattering spectrometry, x‐ray diffraction, transmission electron microscopy. Cluster growth dissolution, as well migration of metal atoms towards sample surface, with a subsequent evaporation, observed to occur at temperatures that depend on atmosphere. In system, formation Ag–Cu phase‐separated clusters was observed.