Structural and electrical properties of rf-sputtered amorphous barium titanate thin films

作者: K. Sreenivas , Abhai Mansingh , M. Sayer

DOI: 10.1063/1.339037

关键词: Amorphous solidMaterials sciencePermittivitySputteringThin filmBarium titanateMineralogyCarbon filmComposite materialFerroelectricityDielectric

摘要: Structural and electrical properties of rf‐sputtered amorphous BaTiO3 thin films grown on water‐cooled substrates have been investigated. The dielectric studied for under varying sputtering gas composition (Ar+O2 mixtures) as a function film thickness, frequency, temperature. As‐grown were in nature highly transparent. Post‐deposition annealing had no discernible effect either structure or properties, there was evidence ferroelectricity. Films sputtered pure argon showed constant e’∼12 with little dependence frequency (0.1–100 kHz) over the temperature range 0–75 °C. thickness percentage oxygen during growth. thickness‐dependent conducting glass could be satisfactorily explained by model based existence electrode barriers. high breakdown voltage (106 V/cm), charge storage capacity (3.1 μC/cm2), frequency‐ temperature‐dependent a‐BaTiO3 show promise application insulating layers thin‐film electroluminescent display devices.

参考文章(28)
Philip F. Kane, Graydon B. Larrabee, Characterization of solid surfaces ,(1974)
K. Sreenivas, T. Sudersena Rao, Abhai Mansingh, Subhash Chandra, Preparation and characterization of rf sputtered indium tin oxide films Journal of Applied Physics. ,vol. 57, pp. 384- 392 ,(1985) , 10.1063/1.335481
Reinhard Stumpe, Dieter Wagner, Dieter Bauerle, The role of surface layers in dielectric measurements in oxidic perovskites Ferroelectrics. ,vol. 56, pp. 145- 148 ,(1984) , 10.1080/00150198408012741
V. Marrello, A. Onton, Electroluminescence efficiency profiles of Mn in ZnS ac thin‐film electroluminescence devices Applied Physics Letters. ,vol. 34, pp. 525- 527 ,(1979) , 10.1063/1.90851
T. Matsuoka, M. Nashikawa, T. Tohda, A. Abe, An AC thin-film EL display with Pr-Mn oxide black dielectric material IEEE Transactions on Electron Devices. ,vol. 33, pp. 1290- 1293 ,(1986) , 10.1109/T-ED.1986.22660
J C Manifacier, J Gasiot, J P Fillard, A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film Journal of Physics E: Scientific Instruments. ,vol. 9, pp. 1002- 1004 ,(1976) , 10.1088/0022-3735/9/11/032
Makoto Kitabatake, Tsuneo Mitsuyu, Kiyotaka Wasa, Structure and dielectric properties of amorphous LiNbO3thin films prepared by a sputtering deposition Journal of Applied Physics. ,vol. 56, pp. 1780- 1784 ,(1984) , 10.1063/1.334185
J. K. Park, W. W. Grannemann, Thin ferroelectric films of BaTiO3 on doped silicon Ferroelectrics. ,vol. 10, pp. 217- 220 ,(1976) , 10.1080/00150197608241982
S.B. Krupanidhi, M. Sayer, A. Mansingh, Electrical characterization of amorphous germanium dioxide films Thin Solid Films. ,vol. 113, pp. 173- 184 ,(1984) , 10.1016/0040-6090(84)90219-0
Makoto Kitabatake, Tsuneo Mitsuyu, Kiyotaka Wasa, Structure and electrical properties of amorphous PbTiO3 thin films sputtered on cooled substrates Journal of Non-crystalline Solids. ,vol. 53, pp. 1- 10 ,(1982) , 10.1016/0022-3093(82)90013-8