作者: Vincenzo d’Alessandro , Pierluigi Guerriero , Santolo Daliento , Matteo Gargiulo
DOI: 10.1016/J.SSE.2011.05.018
关键词: Engineering 、 Shunt (electrical) 、 Equivalent series resistance 、 Current voltage 、 Photovoltaic system 、 Diode 、 Electronic engineering 、 Electrical engineering 、 Electrical and Electronic Engineering 、 Materials Chemistry 、 Electronic, Optical and Magnetic Materials 、 Condensed matter physics
摘要: A straightforward non-invasive method is proposed to accurately evaluate the shunt resistance of an elementary cell a photovoltaic module connected in installed string without requiring prior knowledge parameters intrinsic diodes. The approach relies on measurement current–voltage characteristic whole after intentionally shading selected cell. Calibrated PSPICE simulations are employed illustrate and test its reliability. As case study, resistances several cells belonging series array 10 commercial panels determined.