Thickness difference: a new filtering tool for quantitative electron diffraction.
DOI: 10.1103/PHYSREVLETT.99.125506
关键词: Physics 、 Inelastic scattering 、 Reflection high-energy electron diffraction 、 Low-energy electron diffraction 、 Mott scattering 、 Electron diffraction 、 Electron density 、 Optics 、 Kikuchi line 、 Electron backscatter diffraction 、 Molecular physics
摘要: A new way of filtering electron diffraction patterns has been discovered. Patterns from slightly different specimen thicknesses beyond the mean free path for inelastic scattering are subtracted. Only thickness sensitive information (dominantly elastic) remains. Thermal diffuse and Borrmann effects removed in addition to signal eliminated by conventional energy filtering. One application is quantitative convergent beam without an filter. Structure factors alpha - Al(2)O(3) have measured with average uncertainty 0.25%.
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