Effect of wet oxidized AlxGa1−xAs layer on the interdiffusion of InGaAs/GaAs quantum wells

作者: Joong-Seon Choe , Sang-Wan Ryu , Byung-Doo Choe , H. Lim

DOI: 10.1063/1.367505

关键词: Analytical chemistryQuantum wellX-ray absorption spectroscopyMaterials scienceLayer (electronics)Thermal stabilityGallium arsenideCondensed matter physicsStrain effectIngaas gaasDiffusion

摘要: The effect of wet oxidized AlAs cap layer and AlGaAs interlayer on the thermal stability In0.2Ga0.8As/GaAs quantum well (QW) is studied. QW interdiffusion rate observed to increase with Al composition AlxGa1−xAs until x reaches about 0.5 then saturate for x⩾0.5. When oxidation performed at 380 °C 15 min, threshold value enhancement found be 0.3. It also confirmed that can only explained when strain in InGaAs taken into account.

参考文章(14)
H. Nickel, A DETAILED EXPERIMENTAL STUDY OF THE WET OXIDATION KINETICS OF ALXGA1-XAS LAYERS Journal of Applied Physics. ,vol. 78, pp. 5201- 5203 ,(1995) , 10.1063/1.360736
E. I. Chen, N. Holonyak, S. A. Maranowski, AlxGa1−xAs–GaAs metal–oxide semiconductor field effect transistors formed by lateral water vapor oxidation of AlAs Applied Physics Letters. ,vol. 66, pp. 2688- 2690 ,(1995) , 10.1063/1.113489
J. M. Dallesasse, N. Holonyak, N. El‐Zein, T. A. Richard, F. A. Kish, A. R. Sugg, R. D. Burnham, S. C. Smith, Native‐oxide masked impurity‐induced layer disordering of AlxGa1−xAs quantum well heterostructures Applied Physics Letters. ,vol. 58, pp. 974- 976 ,(1991) , 10.1063/1.104460
G.M. Yang, M.H. MacDougal, P.D. Dapkus, Ultralow threshold current vertical-cavity surface-emitting lasers obtained with selective oxidation Electronics Letters. ,vol. 31, pp. 886- 888 ,(1995) , 10.1049/EL:19950610
Kazuhisa Ogawa, Mitsuo Kawabe, Fermi Level Effect on Compositional Disordering of AlAs/GaAs Superlattice Japanese Journal of Applied Physics. ,vol. 29, pp. 1240- 1242 ,(1990) , 10.1143/JJAP.29.1240
W. J. Choi, S. Lee, Y. Kim, D. Woo, S. K. Kim, S. H. Kim, J. I. Lee, K. N. Kang, J. H. Chu, S. K. Yu, J. C. Seo, D. Kim, K. Cho, Carrier lifetimes in dielectric cap disordered GaAs/AlGaAs multiple quantum well with SiN capping layers Applied Physics Letters. ,vol. 67, pp. 3438- 3440 ,(1995) , 10.1063/1.115272
K. Rammohan, D. H. Rich, M. H. MacDougal, P. D. Dapkus, Thermal processing of strained InGaAs/GaAs quantum well heterostructures bonded to Si via an epitaxial lift-off technique Applied Physics Letters. ,vol. 70, pp. 1599- 1601 ,(1997) , 10.1063/1.118627
Sang‐Wan Ryu, In Kim, Byung‐Doo Choe, Weon Guk Jeong, The effect of strain on the interdiffusion in InGaAs/GaAs quantum wells Applied Physics Letters. ,vol. 67, pp. 1417- 1419 ,(1995) , 10.1063/1.114512
A. L. Holmes, M. R. Islam, R. V. Chelakara, F. J. Ciuba, R. D. Dupuis, M. J. Ries, E. I. Chen, S. A. Maranowski, N. Holonyak, High‐reflectivity visible‐wavelength semiconductor native oxide Bragg reflectors grown by metalorganic chemical vapor deposition Applied Physics Letters. ,vol. 66, pp. 2831- 2833 ,(1995) , 10.1063/1.113444
P. Gavrilovic, D. G. Deppe, K. Meehan, N. Holonyak, J. J. Coleman, R. D. Burnham, Implantation disordering of AlxGa1−xAs superlattices Applied Physics Letters. ,vol. 47, pp. 130- 132 ,(1985) , 10.1063/1.96238