From Device Aging Physics to Automated Circuit Reliability Sign Off

作者: Christian Schlunder , Katja Waschneck , Peter Rotter , Susanne Lachenmann , Hans Reisinger

DOI: 10.1109/IRPS.2019.8720457

关键词: Reliability engineeringInterconnectionElectronic design automationReliability (semiconductor)Product designCircuit designTask (project management)Circuit reliabilityElectronic circuit

摘要: For modern semiconductor product design, reliability aspects have to be considered not only for technology process development but inevitable also during circuit design phase. Electronic automation tools (EDA) support designers analyze the impact of device and interconnect on behavior. The task is ensure specified characteristic circuits throughout entire lifetime product. Meanwhile there are many different available this task. They can categorized according their basic assessment approach.

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