作者: Gaixia Zhang , Dequan Yang , Edward Sacher
DOI: 10.1021/JP074762T
关键词: Oxide 、 Highly oriented pyrolytic graphite 、 Materials science 、 Nanotechnology 、 Chemical engineering 、 Carbide 、 X-ray photoelectron spectroscopy 、 Deposition (law) 、 Vacuum chamber 、 Nanoparticle 、 Carbon
摘要: X-ray photoelectron spectroscopy (XPS) and atomic force microscopy have been used to study Co nanoparticles evaporated onto freshly cleaved highly oriented pyrolytic graphite (HOPG) surfaces. XPS chemical characterization employed symmetrical line shapes was carried out as functions of the amount deposited time subsequent deposition. The nominal amounts ranged from 0.5 175 A. On analyzing relationships among Co2p, C1s, O1s spectra, we found that reacts not only with HOPG surface defects (including oxidized carbon contaminant groups), but also residual C- O-containing species present in vacuum chamber. Both carbide oxide are produced layers around each nanoparticle, stabilizing them preventing further coalescence.