Rapid prototyping of silicon microstructures by means of a new masking process and crystal orientation dependent etching

作者: David Hilbig , Birgit Hannemann

DOI: 10.1016/J.SNA.2010.07.017

关键词: OptoelectronicsDry etchingMaterials scienceEtching (microfabrication)SiliconMicroelectromechanical systemsMachiningLithographyReactive-ion etchingMasking (art)Engineering drawing

摘要: Abstract Silicon micromachining for MEMS components requires deep etching processes in combination with etch-resistant masks. The usual masking and lithographic procedures are expensive unsuitable fast layout changes. We developed a machining possibility, which combines the flexibility of laser direct writing shape quality crystal orientation dependent silicon. main step is substituting SiO 2 or Si 3 N 4 mask layers by metal films. These films can be directly patterned marking system followed well-known etch process KOH.

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