作者: L. A. Eyres , P. J. Tourreau , T. J. Pinguet , C. B. Ebert , J. S. Harris
DOI: 10.1063/1.1389326
关键词: Etching (microfabrication) 、 Molecular beam epitaxy 、 Optoelectronics 、 Chemical vapor deposition 、 Gallium arsenide 、 Substrate (electronics) 、 Isotropic etching 、 Materials science 、 Epitaxy 、 Fabrication
摘要: Orientation-patterned GaAs (OPGaAs) films of 200 μm thickness have been grown by hydride vapor phase epitaxy (HVPE) on an orientation-patterned template fabricated molecular beam (MBE). Fabrication the templates utilized only MBE and chemical etching, taking advantage GaAs/Ge/GaAs heteroepitaxy to control crystal orientation top film relative substrate. Antiphase domain boundaries were observed propagate vertically under HVPE growth conditions so that duty cycle was preserved through thick for all periods attempted. Quasiphase-matched frequency doubling a CO2 laser demonstrated with confocally focused 4.6 mm long OPGaAs film.