Small angle x-ray scattering from the amorphous alloy Fe40Ni40P14B6

作者: J.L. Walter , D.G. Legrand , F.E. Luborsky

DOI: 10.1016/0025-5416(77)90122-7

关键词: Annealing (metallurgy)CrystallographyThermal fluctuationsAuger analysisHigh phosphorusScatteringDiffractionAnalytical chemistryMaterials scienceAmorphous metalSmall-angle X-ray scatteringGeneral Engineering

摘要: Abstract The amorphous alloy Fe 40 Ni P 14 B 6 was examined by small angle X-ray diffraction in the as-formed condition and after annealing, cold rolling annealing. In all cases, annealing temperature well below crystallization of this material. scattering intensity measured related to presence regions or particles within as-quenched contained about 32 A diameter. number apparently increased a factor 3 on for 2 h at 100°C but size remained essentially unchanged. constitute 1% volume are spaced 250 apart. Frozen-in thermal fluctuations accounted 5% background scattering. Cold destroyed they were restored 150°C. It concluded that is caused high phosphorus concentration which first observed Auger analysis fracture surface annealed

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