Crosstalk Characterization of a Two-Tier Pixelated Avalanche Sensor for Charged Particle Detection

摘要: In this paper, a complete optical crosstalk characterization of Geiger-mode pixelated avalanche detector for particle tracking application is presented. The device composed two tiers CMOS-integrated detectors bump bonded with pixel-level interconnects, each layer containing 16 $\times$ 48 array. On-chip coincidence detection circuits, designed to discriminate between particle-triggered events and dark counts, have been used acquire direct measurements. Crosstalk measurements as function excess bias voltage distance different diodes effect substrate thickness evaluated measuring dies three thicknesses: 280, 50, 25 $\mu$ m. Experimental results confirm the role reflected photons at bottom surface device, silicon acting 2-D waveguide thinner samples. global observed when all pixels in array are enabled reported, showing substantial increase Dark Count Rate (DCR) distributions. Pairs vertically aligned unshielded employed characterize intertier crosstalk.