作者: M. Kashefi Biroon , M. Zahedifar , E. Sadeghi , F. Almasifard
DOI: 10.1016/J.RADPHYSCHEM.2019.02.035
关键词: Phosphor 、 Doping 、 Thermoluminescence 、 Analytical chemistry 、 Thermoluminescent Dosimetry 、 Dopant 、 Microcrystalline 、 Annealing (metallurgy) 、 Irradiation 、 Materials science
摘要: Abstract Dy doped SrF2 microcrystalline was prepared by co-precipitation technique. Thermoluminescence (TL) glow curve of γ irradiated SrF2:Dy phosphor consists a main peak at 485 K with small shoulders around 384 K and 590 K. The effects different dopant concentrations annealing regimes on TL sensitivity were investigated the optimum conditions achieved 1 mol% 700 °C for 30 min. Initial rise, variable heating rate, isothermal decay computerized deconvolution (CGCD) methods applied to obtain kinetic parameters material. this is about 10 times more than that LiF;Mg;Ti (TLD-100). Based obtained results, synthesized appropriate dosimetry applications.