Statistical Analysis of ENOB and Yield in Binary Weighted ADCs and DACS With Random Element Mismatch
作者： Jeffrey A. Fredenburg , Michael P. Flynn
DOI: 10.1109/TCSI.2011.2177006
关键词: Shaping 、 Successive approximation ADC 、 Electronic engineering 、 Algorithm 、 Mathematics 、 Expression (mathematics) 、 Effective number of bits 、 Binary number 、 Converters 、 Capacitor 、 Noise (electronics)
摘要: … physical construction of the capacitor array, the constraint on … 4, the calculated variances compress at higher resolutions. … In this Appendix, we derive a linear scaling factor which …
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