Nonlinearity analysis of resistor string A/D converters
作者： S. Kuboki , K. Kato , N. Miyakawa , K. Matsubara
关键词:
摘要: A mismatch in the resistor ratio causes nonlinearity successive-approximation A/D converters fabricated with a 2^{n}R potentiometric technique. This paper describes theoretical analysis of this kind and method evaluating variations resistance obtained experiments monolithic resistors. The are classified into statistically random variation component deterministic component. relationship both components to error is then clarified. 7-bit diffused string was silicon-gate NMOS process. An autocorrelation technique used identify separate several string. On basis experimental results that were obtained, we have developed 10-bit confirmed their accuracy.
sci-hub.se 参考文章(6)
David A. Hodges, Paul R. Gray, Robert W. Broderson, Circuit techniques: Enhancing MOS/LSI's role in analog design: High-density amplifiers, A/D and D/A converters, filters, and coder-decoder circuits can now be fabricated IEEE Spectrum. ,vol. 16, pp. 24- 32 ,(1979) , 10.1109/MSPEC.1979.6368097
A.R. Hamade, A single chip all-MOS 8-bit A/D converter IEEE Journal of Solid-state Circuits. ,vol. 13, pp. 785- 791 ,(1978) , 10.1109/JSSC.1978.1052051
M. Townsend, M.E. Hoff, R.E. Holm, An NMOS Microprocessor for Analog Signal Processing IEEE Journal of Solid-state Circuits. ,vol. 15, pp. 33- 38 ,(1980) , 10.1109/JSSC.1980.1051335
A.G.F. Dingwall, Monolithic expandable 6 bit 20 MHz CMOS/SOS A/D converter IEEE Journal of Solid-state Circuits. ,vol. 14, pp. 926- 932 ,(1979) , 10.1109/JSSC.1979.1051299
R.E. Suarez, P.R. Gray, D.A. Hodges, All-MOS charge-redistribution analog-to-digital conversion techniques. II IEEE Journal of Solid-State Circuits. ,vol. 10, pp. 379- 385 ,(1975) , 10.1109/JSSC.1975.1050630
James L. McCreary, David A. Sealer, Precision Capacitor Ratio Measurement Technique for Integrated Circuit Capacitor Arrays IEEE Transactions on Instrumentation and Measurement. ,vol. 28, pp. 11- 17 ,(1979) , 10.1109/TIM.1979.4314753