Statistical design techniques for D/A converters
作者： C.S.G. Conroy , W.A. Lane , M.A. Moran
DOI: 10.1109/4.34100
关键词:
摘要: Techniques for the design of high-resolution digital-to-analog converters (DACs) that use precision-matched components are described. Statistical models, based on test chip data, that realistically describe both local mismatches and longer range spatial correlations are investigated. These models have been incorporated into a special-purpose DAC analysis/simulation tool (DACSIM) to provide a powerful Monte-Carlo yield estimation capability. DACSIM also performs accurate DC simulation of a large class of resistor-network …
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