A Statistical Model Including Parameter Matching for Analog Integrated Circuits Simulation
作者： S. Inohira , T. Shinmi , M. Nagata , T. Toyabe , K. Iida
DOI: 10.1109/TCAD.1985.1270162
关键词:
摘要: This paper describes a statistical model for circuit simulation that predicts variations in behavior. includes parameter matching considerations critical to analog integrated circuits (IC's). The is based on experimental data gathered from standard production bipolar-analog chips. By using multivariate techniques, the constructed having two kinds of sub-models. One sub-model uses eigenvalues and vectors correlation matrix, then generates between devices chip. other linear regression equations within device. has been implemented into simulator simulations are performed. Measured device IC's well reproduced practical execution time by model. Simulation examples demonstrated illustrate effectiveness
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