Reverse-directional explosive crystallization of microstructures in transparent film on absorbing substrate by a multipulse femtosecond radiation
作者： А.S. Elshin , I.P. Pronin , O.M. Zhigalinа , M.Yu. Presniakov , D.N. Khmelenin
DOI: 10.1016/J.SSC.2015.10.001
关键词: Femtosecond 、 Crystallization 、 Transmission electron microscopy 、 Ferroelectricity 、 Perovskite (structure) 、 Silicon 、 Optoelectronics 、 Explosive material 、 Substrate (electronics) 、 Optics 、 Materials science
摘要: Abstract The crystallization in a transparent precursor of perovskite ferroelectric film deposited on an absorbing platinized silicon substrate initiated by multipulse femtosecond sharply focused laser beam near-infrared spectral range is studied transmission electron microscopy. Time dependences the shapes crystallized areas point to initiation explosive with seed opposite side heat source localized platinum interface layer. radius crystalized semispheres varies from 150 900 nm, maximal velocity up 1.2 cm/s. Reverse direction spherical wave front propagation regarding explained terms developed model based thermal stress-induced modification activation energy.
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