作者: Hui-Huang Chen , Chih-Yuan Chen , Chun-Cheng Chen , Sheng-Fu Yang
DOI:
关键词: Dynamic random-access memory 、 Capacitor 、 Transistor 、 Gate oxide 、 Drain-induced barrier lowering 、 Electrical engineering 、 Gate dielectric 、 Optoelectronics 、 Layer (electronics) 、 Semiconductor 、 Materials science
摘要: A dynamic random access memory cell having vertical channel transistor includes a semiconductor pillar, drain layer, an assisted gate, control source and capacitor. The has active region formed by the pillar. layer is at bottom of gate beside separated from first dielectric layer. second top capacitor to electrical connect