作者: Chung-Wei Lin , Ming-Chao Tsai , Kuang-Yao Lee , Tai-Chen Chen , Ting-Chi Wang
DOI: 10.1109/ASPDAC.2007.357992
关键词: Manufacturing engineering 、 Manufacturing process 、 Physical design 、 Key (cryptography) 、 Design for manufacturability 、 Process (engineering) 、 Systems engineering 、 Engineering 、 Reliability (statistics) 、 Scale down
摘要: … antee yield and reliability, physical design for manufacturability and reliability has played a pivotal role in resolution and thus yield … in physical design for manufacturability and reliability. …