作者: Denis Lynch , Chris Rossouw
DOI: 10.1016/0304-3991(87)90008-8
关键词: Diffraction 、 Electron 、 Zone axis 、 Tilt (optics) 、 Optics 、 Probability density function 、 Chemistry 、 Bloch wave 、 Molecular physics 、 Atom 、 Beam (structure)
摘要: Abstract The depth-dependence of fast electron probability density is calculated for the 〈111〉 zone axis orientation GaAs, and effects slight tilt from this orientation. Although Ga As project onto equivalent sites beams in zeroth-order Laue zone, differences mean on occur, due to higher-order effects. Whether preferential peaking takes place or depends upon which atom assumed be top surface layer. 64×64 beam multislice calculations are compared with 49-beam Bloch wave computations, oscillatory not accounted for. These results have implications interpretation dynamical X-ray fluorescence effects, particularly site determination under diffraction conditions.