In situ electro-mechanical experiments and mechanics modeling of tensile cracking in indium tin oxide thin films on polyimide substrates

作者: Cheng Peng , Zheng Jia , Dan Bianculli , Teng Li , Jun Lou

DOI: 10.1063/1.3592341

关键词: Fracture toughnessComposite materialFracture mechanicsMaterials scienceFlexible electronicsElectrical resistance and conductanceToughnessPolyimideIndium tin oxideThin film

摘要: … in situ electro-mechanical experiments and mechanics modeling to decipher the failure mechanics of ITO thin films on … Our mechanics model offers quantitative determination of critical …

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