作者: S. Nagar , S.K. Gupta , S. Chakrabarti
DOI: 10.1016/J.SPMI.2012.10.008
关键词: Photoluminescence 、 X-ray crystallography 、 Thin film 、 Scanning electron microscope 、 Materials science 、 Exciton 、 Annealing (metallurgy) 、 Ion 、 Analytical chemistry 、 Pulsed laser deposition
摘要: Abstract Lithium ions were implanted at low energies (40 and 50 keV) a dosage of 5 × 1013 ions/cm2 over 〈0 0 2〉 ZnO thin films that had been deposited by pulsed laser deposition. The samples subsequently treated rapid thermal annealing 750 °C. Scanning electron microscopy images revealed improved grain formation for the samples. However, presence microvoids was also observed in these samples; amount tended to increase on high-temperature annealing. Dominant donor-bound-exciton peaks is all along with some defect related exciton bound although lesser intensity compared as-deposited sample.