Thermally induced losses in ultra-cold atoms magnetically trapped near room-temperature surfaces

作者: D. M. Harber , J. M. McGuirk , J. M. Obrecht , E. A. Cornell

DOI: 10.1023/A:1026084606385

关键词: SiliconDielectric surfaceAtomic physicsAdsorptionMagnetic trapUltracold atomAtom chipMaterials scienceElectrical resistivity and conductivity

摘要: We have measured magnetic trap lifetimes of ultra-cold 87Rb atoms at distances 5–1000 µm from surfaces conducting metals with varying resistivity. Good agreement is found a theoretical model for losses arising near-field thermal noise, confirming the complications associated holding trapped close to surfaces. A dielectric surface (silicon) was in contrast be so benign that we are able evaporatively cool Bose–Einstein condensate by using selectively adsorb higher energy atoms.

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