作者: N. Barrett , J. E. Rault , J. L. Wang , C. Mathieu , A. Locatelli
DOI: 10.1063/1.4801968
关键词: Photoemission electron microscopy 、 Electron optics 、 Electron 、 Ferroelectricity 、 Work function 、 Electronic band structure 、 Low-energy electron microscopy 、 Reciprocal lattice 、 Materials science 、 Optoelectronics
摘要: The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy (LEEM) techniques to the study electronic chemical structure ferroelectric materials is reviewed. optics in both gives spatial resolution a few tens nanometres. PEEM images photoelectrons whereas LEEM reflected elastically backscattered electrons. Both can be used direct reciprocal space imaging. Together, they provide access surface charge, work function, topography, mapping, crystallinity band structure. Examples applications for thin films single crystals are presented.