Nanoscale Probing of Ferroelectric Domain Switching Using Piezoresponse Force Microscopy
作者： Sang Mo Yang , Yunseok Kim , None
DOI: 10.4191/KCERS.2019.56.4.05
关键词: Materials science 、 Capacitor 、 Ferroelectricity 、 Optoelectronics 、 Domain (software engineering) 、 Piezoresponse force microscopy 、 Nanoscopic scale
摘要:
sci-hub.st 参考文章(63)
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