Investigation of turn-on voltage shift in organic ferroelectric transistor with high polarity gate dielectric

作者: C.A. Nguyen , P.S. Lee , S.G. Mhaisalkar

DOI: 10.1016/J.ORGEL.2007.01.010

关键词: Analytical chemistryCharge carrierField-effect transistorOrganic electronicsThin-film transistorThreshold voltageCondensed matter physicsOrganic semiconductorMaterials scienceDielectricGate dielectricElectrical and Electronic EngineeringMaterials ChemistryElectronic, Optical and Magnetic MaterialsGeneral chemistryBiomaterials

摘要: Abstract Large positive shifts of turn-on voltage Vto were observed in ferroelectric organic thin film transistor using P(VDF-TrFE) copolymer (57–43 mol%) as gate insulator during OFF to ON state sweeping. The shift the transfer characteristic up +25 V is attributed accumulation mobile charge carriers (holes) pentacene layer even device state. phenomena first discussed on basis a negative surface potential created by dipole field polar dielectric and trap states an semiconductor layer. It was however found that these unable fully address strong due presence large polarization A mechanism polarization-compensating charges which are injected region next proposed examined understand phenomenon. change with different magnitude pulses, corresponds amount for compensation. Time measurement drain current shows transient decaying behavior when bias switched from polarity confirms trapping insulator.

参考文章(23)
Denis Rollik, Siegfried Bauer, Reimund Gerhard(-Multhaupt), Separate contributions to the pyroelectricity in poly(vinylidene fluoride) from the amorphous and crystalline phases, as well as from their interface Journal of Applied Physics. ,vol. 85, pp. 3282- 3288 ,(1999) , 10.1063/1.369672
K. N. Narayanan Unni, Remi de Bettignies, Sylvie Dabos-Seignon, Jean-Michel Nunzi, A nonvolatile memory element based on an organic field-effect transistor Applied Physics Letters. ,vol. 85, pp. 1823- 1825 ,(2004) , 10.1063/1.1788887
S. Kobayashi, T. Nishikawa, T. Takenobu, S. Mori, T. Shimoda, T. Mitani, H. Shimotani, N. Yoshimoto, S. Ogawa, Y. Iwasa, Control of carrier density by self-assembled monolayers in organic field-effect transistors Nature Materials. ,vol. 3, pp. 317- 322 ,(2004) , 10.1038/NMAT1105
R.C.G. Naber, M. Mulder, B. de Boer, P.W.M. Blom, D.M. de Leeuw, High charge density and mobility in poly(3-hexylthiophene) using a polarizable gate dielectric Organic Electronics. ,vol. 7, pp. 132- 136 ,(2006) , 10.1016/J.ORGEL.2005.11.007
C. H. Seager, D. C. McIntyre, W. L. Warren, B. A. Tuttle, Charge trapping and device behavior in ferroelectric memories Applied Physics Letters. ,vol. 68, pp. 2660- 2662 ,(1996) , 10.1063/1.116273
M.G. Broadhurst, G.T. Davis, A.S. DeReggi, S.C. Roth, R.E. Collins, Pyroelectricity and charge transport in a copolymer of vinylidene fluoride and tetrafluoroethylene Polymer. ,vol. 23, pp. 22- 28 ,(1982) , 10.1016/0032-3861(82)90008-8
S. L. Miller, P. J. McWhorter, Physics of the ferroelectric nonvolatile memory field effect transistor Journal of Applied Physics. ,vol. 72, pp. 5999- 6010 ,(1992) , 10.1063/1.351910
Soeren Steudel, Stijn De Vusser, Stijn De Jonge, Dimitri Janssen, Stijn Verlaak, Jan Genoe, Paul Heremans, Influence of the dielectric roughness on the performance of pentacene transistors Applied Physics Letters. ,vol. 85, pp. 4400- 4402 ,(2004) , 10.1063/1.1815042
J. Veres, S.D. Ogier, S.W. Leeming, D.C. Cupertino, S. Mohialdin Khaffaf, Low-k Insulators as the Choice of Dielectrics in Organic Field-Effect Transistors Advanced Functional Materials. ,vol. 13, pp. 199- 204 ,(2003) , 10.1002/ADFM.200390030
Andrew J. Lovinger, G. T. Davis, T. Furukawa, M. G. Broadhurst, Crystalline forms in a copolymer of vinylidene fluoride and trifluoroethylene (52/48 mol %) Macromolecules. ,vol. 15, pp. 323- 328 ,(1982) , 10.1021/MA00230A024