Evaluation and Control of Plastic Deformation in GaAs Film on Si Substrate by Means of Crystal Plasticity Analysis
作者： Tetsuya Ohashi
DOI: 10.1557/PROC-280-403
关键词: Composite material 、 Crystallography 、 Si substrate 、 Crystal plasticity 、 Materials science
摘要:
sci-hub.se 参考文章(9)
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