The determination of the thickness of electrodeposited polymeric films by AFM and electrochemical techniques
作者： Krzysztof Bieńkowski , Marcin Strawski , Marek Szklarczyk
DOI: 10.1016/J.JELECHEM.2011.06.014
关键词: Polymerization 、 Electrochemistry 、 Range (particle radiation) 、 Capacitance 、 Analytical chemistry 、 Chemistry 、 Polymer 、 Ion 、 Monomer 、 Electron
摘要: The AFM scratching technique was applied to determine the absolute thickness of the electrodeposited poly o-methoxyaniline films in dependence of an anion type (SO42-, Cl …
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