A precision back-reflexion microbeam X-ray camera with provision for pre-selecting the irradiated area
作者： R W Cahn
DOI: 10.1088/0950-7671/30/6/308
关键词: Microbeam 、 Beam (structure) 、 Optics 、 Collimated light 、 FOIL method 、 Pinhole (optics) 、 Irradiation 、 Materials science 、 X-ray
摘要: A camera is described which allows the orientations of pre-selected individual grains in an aggregate to be accurately determined. pinhole a metal foil mounted next specimen used as reference point, through X-ray beam sent by taking readings from electronic counter placed behind foil. The principles collimation are discussed.
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