作者: Jiuhua Chen , Donald J. Weidner , Liping Wang , Michael T. Vaughan , Christopher E. Young
DOI: 10.1016/B978-044451979-5.50011-9
关键词: Beam (structure) 、 Melting curve analysis 、 Analytical chemistry 、 Synchrotron 、 Diffraction 、 Brightness 、 Materials science 、 Volume (thermodynamics) 、 Intensity (heat transfer) 、 Phase (matter)
摘要: A new technique for density measurement of molten materials in a multi-anvil press using synchrotron X-ray radiography is described. This takes advantage linear conversion intensity to radiograph brightness, and records two-dimensional variations transmitted intensities across reference sphere the sample on single exposure. Comparing with existing one-dimensional scan small beam X-rays melt at high pressure, this method gains shorter data collection time larger coverage (two-dimensional). Melting volume FeS 4.1 GPa determined be 0.28 cm3/mol slope melting curve estimated 41°C/GPa. experiment demonstrates an accuracy 1% respect diffraction crystalline phase.