Characterization of Stress, Pressure, and Temperature in SAm85, a Dia Type High Pressure Apparatus
作者： Donald J. Weidner , Michael T. Vaughan , Jaidong Ko , Yanbin Wang , Xing Liu
DOI: 10.1029/GM067P0013
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摘要: A DIA‐type cubic‐anvil high‐pressure apparatus (SAM85) has been interfaced with white x‐ray radiation from the superconducting wiggler port of the National Synchrotron Light Source at Brookhaven National Laboratory. Energy‐dispersive x‐ray diffraction measurements were conducted on samples with dimensions of the order of 1 mm as a function of pressure and temperature utilizing x‐ray energies of up to 100 keV. The sample environment is examined. Pressure is uniform in the sample chamber to within 0.1 GPa, and temperature is constant in …
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