Method and apparatus for creating imaging recipe

作者: Wataru Nagatomo , Hidetoshi Morokuma , Ryoichi Matsuoka , Takumichi Sutani , Atsushi Miyamoto

DOI:

关键词: Artificial intelligenceBrightnessComputer graphics (images)Computer visionImage file formatsMinimum timeDimension (vector space)RecipeEngineeringImage (mathematics)CAD

摘要: In an imaging recipe creating apparatus that uses a scanning electron microscope to create for SEM observation of semiconductor pattern, in order the measuring wiring width and other various dimension values pattern from image thus evaluating shape is automatically generated within minimum time by analysis using CAD obtained conversion data, creation unit creates converting data into format includes image-quantizing determining section, brightness information providing deformation processing section; being created unit.

参考文章(25)
Timothy E. Neary, Edward W. Conrad, Orest Bula, Feedback method to repair phase shift masks ,(1997)
Harry Stanton Gallarda, Lakshman Srinivasan, Jun Liu, Kais Jameel Maayah, Richard Barnard, Automated repetitive array microstructure defect inspection ,(2001)
Wataru Nagatomo, Hidetoshi Morokuma, Ryoichi Matsuoka, Takumichi Sutani, Atsushi Miyamoto, Method and apparatus for arranging recipe of scanning electron microscope and apparatus for evaluating shape of semiconductor device pattern ,(2006)
Hidetoshi Nishiyama, Takafumi Okabe, Yukihiro Shibata, Shunji Maeda, Method of inspecting defects ,(2004)
Wataru Nagatomo, Hidetoshi Morokuma, Ryoichi Matsuoka, Atsushi Miyamoto, Scanning Electron Microscope and a Method for Imaging a Specimen Using the Same ,(2012)
Asahiro Kuni, Chie Shishido, Hiroshi Miyai, Takashi Hiroi, Masahiro Watanabe, Maki Tanaka, Aritoshi Sugimoto, Yasuhiko Nara, Pattern inspection method and apparatus ,(2007)
Scott Westfall, Daniel Piper, Automated metrology recipe generation ,(2005)