Quantitative analysis of a fracture surface by atomic force microscopy.
作者： Pascal Daguier , Stéphane Henaux , Elisabeth Bouchaud , François Creuzet
关键词: Materials science 、 Surface finish 、 Nanoindentation 、 Alloy 、 Condensed matter physics 、 Conductive atomic force microscopy 、 Nanotechnology 、 Scanning electron microscope 、 Fractal 、 Magnetic force microscope 、 Fracture (geology)
摘要: The fracture surface of a ${\mathrm{Ti}}_{3}$Al-based alloy is studied using both an atomic force microscope and standard scanning electron microscope. Results are shown to be quantitatively comparable. Two regimes observed. It shown, in particular, that the roughness index characterizing small length scales regime equal 0.5. Furthermore, large fractal domain found spread over five decades scales. \textcopyright{} 1996 American Physical Society.
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