Calibration apparatus, methods and applications
作者： Sarvani Piratla , Amit Lal
DOI:
关键词: Base (geometry) 、 Optics 、 Physics 、 Inertial measurement unit 、 Diffraction 、 Calibration 、 Inertial frame of reference 、 Grating 、 Inertial reference unit
摘要: An inertial sensor calibration method and apparatus. One or more diffraction patterns are generated by one fixed and/or moveable gratings (inertial sensors) illuminated an atomically stabilized source attached to a base detected imager. The grating has designed parameter value actual respective value, such as motion distance that can be determined upon ultra-precise measurement. Such measurement used calibrate the sensor.
lens.org 参考文章(10)
Bruce A. Block, Paul Davids, Brandon C. Barnett, Optical clocking with a ring resonator ,(2003)
Dustin Wade Carr, Accelerometer with enhanced DC stability ,(2009)
Tony Mule, Thomas K. Gaylord, James D. Meindl, Back-side-of-die, through-wafer guided-wave optical clock distribution networks, method of fabrication thereof, and uses thereof ,(2003)
Stewart M. Kohler, James J. Allen, Inertial measurement unit using rotatable MEMS sensors ,(2006)
Yves Taillon, Paul Grenier, Apparatus for reshaping an optical beam bundle ,(2003)
Ashok V. Krishnamoorthy, John E. Cunningham, Ronald Ho, Robert J. Drost, Multi-phase clocking of integrated circuits using photonics ,(2007)
Murat Okandan, Gregory N. Nielson, Microelectromechanical inertial sensor ,(2009)
Robert J. Drost, Ronald Ho, Ashok V. Krishnamoorthy, John E. Cunningham, Clocking of integrated circuits using photonics ,(2007)
Takuo Ishida, 浩則 上, Hironori Kami, 拓郎 石田, 宏 齊藤, Hiroshi Saito, Semiconductor acceleration sensor and inspecting method for the semiconductor acceleration sensor ,(2000)