Photon emission with the scanning tunneling microscope
作者： J. K. Gimzewski , B. Reihl , J. H. Coombs , R. R. Schlittler
DOI: 10.1007/BF01314531
关键词: Scanning probe microscopy 、 Spin polarized scanning tunneling microscopy 、 Atomic physics 、 Electrochemical scanning tunneling microscope 、 Scanning tunneling spectroscopy 、 Photon 、 Materials science 、 Scanning Hall probe microscope 、 Scanning tunneling microscope 、 Inverse photoemission spectroscopy
摘要: By placing a photon detector near the tip-sample region of scanning tunneling microscope, we have measured isochromat photon-emission spectra polycrystalline tantalum and Si(111)7×7 at energies 9.5 eV. Such contain electronic-structure information comparable to inverse photoemission spectroscopy, but with high lateral/spatial resolution. The implications this new observation are discussed.
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