Evidence for a Crucial Role Played by Oxygen Vacancies in LaMnO3 Resistive Switching Memories

作者: Zhong-tang Xu , Kui-juan Jin , Lin Gu , Yu-ling Jin , Chen Ge

DOI: 10.1002/SMLL.201101796

关键词: FabricationScanning transmission electron microscopyAnnealing (metallurgy)OxygenNanotechnologyLattice constantSchottky barrierMaterials sciencePerovskite (structure)Electronic structureChemical physics

摘要: LaMnO3 (LMO) films are deposited on SrTiO3:Nb (0.8 wt%) substrates under various oxygen pressures to obtain different concentrations of vacancies in the films. The results X-ray diffraction verify that with a decrease pressure, c-axis lattice constant LMO becomes larger, owing an increase vacancies. Aberration-corrected annular-bright-field scanning transmission electron microscopy atomic resolution and sensitivity for light elements is used, which clearly shows number increases pressure during fabrication. Correspondingly, resistive switching property more pronounced Furthermore, numerical model based modification interface induced by migration these structures proposed elucidate underlying physical origins. calculated good agreement experimental data, reveal from theoretical point view variation Schottky barrier at applied bias dominate characteristic. It promising perovskite oxides can be manipulated controlling fabrication or later annealing atmosphere.

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